IEEE P2818™ - Reliability Component Stress Analysis and Derating Standard

IEEE Reliability Society/ IEEE Reliability (RS/SC) & Reliability Stress Analysis and Derating Working Group Meeting

There are many industry and military standards for component derating, but current practice remains ad-hoc and non-scientific. Derating levels are chosen based on historical practice and rules of thumb rather than chosen based on the reliability outcome that is desired for the product or required for the application environment. This standard will establish uniform methods to strategically select and apply derating factors for reliable electronic system design.

The purpose of this standard is to improve electronic, electrical, or electromechanical product reliability by deliberately operating components at applied stress levels (i.e., voltage, current, temperature, power, etc.) that are less than the component is rated for.
This meeting will take place virtually via WebEx.
Date: Tuesday, 17 November 2020
Time : 1:00 PM EST | 10:00 AM PST
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For additional information, contact the IEEE P2818™ Working Group Chair,  Lori Bechtold , at  or the IEEE SA Program Manager,  Christian Orlando, at .
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