CALL FOR PARTICIPATION
IEEE P2818™ - Reliability Component Stress Analysis and Derating Standard

IEEE Reliability Society/ IEEE Reliability (RS/SC) & Reliability Stress Analysis and Derating Working Group Meeting

 
 
 
 
 
WHY GET INVOLVED
 
 
 
 
 
There are many industry and military standards for component derating, but current practice remains ad-hoc and non-scientific. Derating levels are chosen based on historical practice and rules of thumb rather than chosen based on the reliability outcome that is desired for the product or required for the application environment. This standard will establish uniform methods to strategically select and apply derating factors for reliable electronic system design.

The purpose of this standard is to improve electronic, electrical, or electromechanical product reliability by deliberately operating components at applied stress levels (i.e., voltage, current, temperature, power, etc.) that are less than the component is rated for.
 
 
MEETING INFORMATION
 
 
 
 
 
This meeting will take place virtually via WebEx.
 
 
Date: Tuesday, 17 November 2020
Time : 1:00 PM EST | 10:00 AM PST
 
 
HOW TO PARTICIPATE
 
 
 
 
 
  1. Log in to the myProject system to indicate interest in following or participating in this effort.
    • Note: An IEEE SA account is needed to access the system - just click on 'Create Account' if you do not already have one.
  2. Click on the 'Menu' icon at the top of the page and go to the 'Manage Profile and Interests' page.
  3. Click on the 'Interests' tab, click on the 'Add Groups' and search for 'P2818.' Click on the button in the 'Groups I am Interested In' column to indicate interest in the group.
  4. Indicate whether you want to follow or participate in the activity and declare your affiliation.
Need help? Click on the 'Help' icon at the top of the page for assistance.
 
 
For additional information, contact the IEEE P2818™ Working Group Chair,  Lori Bechtold , at  loribechtold@comcast.net  or the IEEE SA Program Manager,  Christian Orlando, at  c.orlando@ieee.org .
 
 
 
 
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