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IEEE Instrumentation and Measurement Society Newsletter
December 2014
In this issue
  • New Look
  • I&M Conference Calendar
  • I&M Magazine Update
  • Call for Nominations: IEEE Fellows
  • Call for Participation: I&M Technical Committees
  • I&M AdCom New Members
  • I&M AdCom Meeting
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IEEE Instrumentation & Measurement Magazine
The December Issue of IEEE Instrumentation & Measurement Magazine is in the mail and is retrievable now from IEEE Xplore, the IEEE online digital library.

All IEEE Instrumentation & Measurement Magazine subscribers can access the online edition using their IEEE Account.

Image of Dec 2014 IEEE I&M Magazine

Feature articles in this issue:
  • "Measurement science: constructing bridges between reality and knowledge"
  • "What are metrologists made of?"
  • "The mathematical theory of evidence and measurement uncertainty"
  • "Using neural network techniques in environmental sensing and measurement systems to compensate for the effects of influence quantities"
  • "Impact factor and research quality"
  • "Electrical distribution system state estimation: measurement issues and challenges"
  • "Grinding dynamometer for vertical glass edge grinding machine with V-grinding wheel"

IEEE Instrumentation and Measurement Magazine Success
From Wendy Van Moer, Editor-in-Chief of IEEE Instrumentation and Measurement Magazine:

"You all probably noticed that a lot of things changed for our magazine. It all started with the June 2014 issue. And I can tell you that the readers like this face-lift.

We have received a request from the IEEE Life Sciences Community to repost these three articles from our June 2014 issue:
They are convinced that these articles are a nice fit with the interest of their readers.
I believe we are going in the right direction."

I&M Chapters
On the I&M Chapter Activities Web site, you can find resources to help in Chapter formation, Chapter Activities, Chapter funding, etc.

Please contact Sergio Rapuano, I&M Chapter Liaison, with any questions or concerns.

IEEE Senior Membership
IEEE Senior Membership is the highest grade for which application may be made and requires experience reflecting professional maturity. Candidates need to be an engineer, scientist, educator, technical executive, or originator in IEEE-designated fields in professional practice for at least ten years and shall have shown significant performance over a period of at least five of those years.

An application for Senior Membership requires three references unless nominated by a Senior member, and in that case requires two references.

Congratulations to the newly elevated Senior members for 2014 thus far: Robert Estes, Bradley Gulka, Siddharth Ladhake, Horst Rogalla, Grzegorz Wiczynski, Jin Bains, Roberto Tinarelli, William Berger, Teresa Duepner, Pasquale Arpaia, Leonid Belostotski, Jafar Ghaisari, Jian Li, Christopher Salthouse, Yiyu Shi, Jer-Liang Yeh, Bharat Gupta, Paul Haake, Phil Bartley, Manuel C. Blanco, Dean Hoegemeyer, David Macii, Rajendra Mistry, Yiannakis Mylonas, Macaulay Osaisai, Charles Hayes, Leonardo Trigo, Michal Kaczmarek, Thamir Murad, Akihito Otani, Jorge Salazar, German Munoz-Hernandez, Emeka Okorie, Umesh Pati and Shabana Urooj.

Newly Elected Administrative Committee Members-at-Large
Congratulations to the following candidates who have been elected for a four-year term 1 January 2015 - 31 December 2018:
  • Salvatore Baglio
  • Zheng Liu
  • Dario Petri
  • Juan Manuel Ramirez Cortés


About the IEEE Instrumentation and Measurement Society Newsletter

Engineers today start their careers with excellent technical skills and subject matter. The IEEE Instrumentation and Measurement Society (I&M) Newsletter includes time sensitive news useful to its members and highlights content of the current issue of IEEE Instrumentation and Measurement Magazine.

We Have a New Look!

The branding elements of the IEEE I&M Society have undergone a recent redesign. Visit our Web site for more information.

I&M Conference Calendar

The 2015 IEEE Sensors Applications Symposium (SAS) will be held 13-15 April 2015 in Zadar, Croatia. Online registration is now open.

Important Deadlines:
  • Acceptance/Rejection/Revision Notification: 16 January 2015
  • Final Paper Submission: 6 February 2015
  • Final Acceptance/Rejection Notification: 27 February 2015
Visit the conference Web site for more information.

The 2015 IEEE International Symposium on Medical Measurements and Applications (MeMeA) will be held 7-9 May 2015 in Torino, Italy. This year's symposium theme is Medical measurements: a need and a challenge.

Important Deadlines:
  • Acceptance/Rejection/Revision Notification: 2 February 2015
  • Final Paper Submission: 2 March 2015
Visit the conference Web site for more information.

The 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) will be held 11-14 May 2015 in Pisa, Italy. Online registration for the conference is now open

Important Deadlines:
  • Submission of Final Paper: 12 January 2015
  • Final Paper Acceptance: 9 February 2015
Visit the conference Web site for more information.

The 2015 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA) will be held 12-14 June 2015 in Shenzhen, China. View the Call for Papers.

Important Deadlines:
  • FULL Paper Submission: 15 January 2015
  • Acceptance Notification: 15 February 2015
  • Final Paper Submission: 15 March 2015
Visit the conference Web site for more information.

I2MTC 2017 Announcement

The 2017 IEEE International Instrumentation and Measurement Technology Conference will be held in Natal, Brazil. More updates to come!

Call for Nominations for IEEE Fellows

Please consider serving as the nominator for an I&M Society colleague you know who is eligible for nomination as an IEEE Fellow! The deadline for nominations is 1 March 2015. For your reference, we have included the Requirements for Fellow nomination and the Duties of the Nominator on our Web site. We also have a section for Tips for IEEE Fellow Nominations.

Visit the IEEE Fellows Program Web site for detailed information about the program and nomination process.

Please visit our Web site for the full solicitation for nominations.

Congratulations to I&M Members Elevated to IEEE Fellow

We would like to congratulate the I&M Members Elected IEEE Fellows in 2014.
I&M members elevated by I&M Society:
  • Paolo Carbone
  • Nachappa Gopalsami
  • Gaozhi Xiao
View their full citation and contact information.

I&M members elevated by another Society or Council are:
  • Alan Finkel
  • David Pommerenke
  • Martin Buehler
  • Edmund Lam
  • Paul Hale
Call for Participation in the I&M Technical Committees

I&M members willing to contribute to the IEEE standardization efforts please consider your active involvement in the IEEE P1871.2™ Working Group - Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adaptors and Test Equipment.

Please contact your chair to participate as a member of one of the I&M Technical Committees:
For the full Call for Participation, please visit our Web site.

I&M Administrative Committee

The Instrumentation and Measurement's Society Administrative Committee held their Fall AdCom Meeting 9-11 October 2014 in Stresa, Italy.

Row 1 (L-R): Jorge Daher, Kristen Donnell, Frank Reyes, Alessandra Flammini, Lee Barford, Max Cortner
Row 2 (L-R): Wendy Van Moer, Ferdinanda Ponci, Mihaela Albu
Row 3 (L-R): Shervin Shirmohammadi, Richard Hochberg, Jenny Wirandi, Ruth Dyer
Row 4 (L-R): Ruqiang Yan, Thomas Roth, Dario Petri, Mark Yeary, Reza Zoughi, Alessandro Ferrero

In Stresa the following officers were appointed for the upcoming term:
  • President: Reza Zoughi
  • Exec. VP: Ruth Dyer
  • VP Finance: Dario Petri
  • VP Conf: Alessandra Flammini
  • VP Pubs: Mark Yeary
  • VP Membership: Shervin Shirmohammadi
  • VP Technical: Mihaela Albu
  • VP Education: Max Cortner
  • Treasurer: Frank Reyes
  • Sr. Past Pres: Kim Fowler
  • Jr. Past Pres: Jorge F. Daher
For more information, visit our Web site.

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